Paper Title
Thickness Dependent of Electrical Properties of Un-doped ZnO Thin Films

The present paper reports the thickness dependent resistivity measurement studies in undoped ZnO thin films. The ZnO thin films were grown by physical vapor deposition technique. During the film growth the nano crystalline films accumulated a considerable amount of oxygen vacancies. The results demonstrate the oxygen vacancy controlled resistive behavior of ZnO thin films. These surprising findings are very important and crucial for developing ZnO based sensors and will help in related areas of research. Keywords - AFM, ZnO, Resistivity